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 2SK2980
Silicon N Channel MOS FET High Speed Power Switching
ADE-208-571B (Z) 3rd. Edition Jun 1998 Features
* Low on-resistance R DS(on) = 0. 2 typ. (VGS = 4 V, I D = 500 mA) * 2.5V gate drive devices. * Small package (MPAK)
Outline
MPAK
3 1
D
2
G
1. Source 2. Gate 3. Drain
S
2SK2980
Absolute Maximum Ratings (Ta = 25C)
Item Drain to source voltage Gate to source voltage Symbol VDSS VGSS Ratings 30 +12 -10 Drain current Drain peak current Channel dissipation Channel temperature Storage temperature Note: ID I D(pulse) Pch Tch Tstg
Note1 Note2
Unit V V V A A W C C
1.0 4 0.8 150 -55 to +150
1. PW 10s, duty cycle 1 % 2. Value at when using alumina ceramic board (12.5 x 20 x 0.7 mm)
2
2SK2980
Electrical Characteristics (Ta = 25C)
Item Drain to source breakdown voltage Gate to source breakdown voltage Zero gate voltege drain current Gate to source leak current I DSS I GSS Symbol V(BR)DSS V(BR)GSS Min 30 +12 -10 -- -- 0.5 -- Typ -- -- -- -- -- -- 0.2 Max -- -- -- 1.0 5.0 1.5 0.28 Unit V V V A A V S Test Conditions I D = 100A, VGS = 0 I G = +100A, VDS = 0 I G = -100A, VDS = 0 VDS = 30 V, VGS = 0 VGS = 8V, VDS = 0 I D = 10A, VDS = 5V I D = 500 mA VGS = 4V Note3 -- 0.3 0.5 I D = 500 mA VGS = 2.5V Note3 1.2 2.0 -- I D = 500 mA VDS = 10V Note3 Input capacitance Output capacitance Ciss Coss -- -- -- -- -- -- -- 155 75 35 12 30 35 30 -- -- -- -- -- -- -- pF pF pF ns ns ns ns VDS = 10V VGS = 0 f = 1MHz VGS = 4V, ID = 500 mA RL = 20
Gate to source cutoff voltage VGS(off) Static drain to source on state RDS(on) resistance Static drain to source on state RDS(on) resistance Forward transfer admittance |yfs|
Reverse transfer capacitance Crss Turn-on delay time Rise time Turn-off delay time Fall time Note: 3. Pulse test 4. Marking is "ZZ- " t d(on) tr t d(off) tf
3
2SK2980
Main Characteristics
Power vs. Temperature Derating 1.6 100 Test condition : When using alumina ceramic board (12.5 x 20 x 0.7 mm) 1.2 30
Maximum Safe Operation Area
Channel Dissipation Pch (W)
Drain Current I D (A)
10 3 1 0.3 0.1 0.03
10 s 100 s
0.8
0.4
Operation in this area is limited by R DS(on)
1m s =1 0m (1 DC sh s Op ot) era tio n
PW
0
50
100
150 Ta (C)
200
Ambient Temperature
Ta = 25 C 0.01 3 30 0.1 0.3 1 10 Drain to Source Voltage V DS (V)
100
Typical Output Characteristics 1.0 4V 2.5 V Pulse Test 1.0
Typical Transfer Characteristics
Drain Current I D (A)
0.8
Drain Current I D (A)
2V
0.8 25C 0.6 75C Tc = -25C
0.6 1.8 V
0.4
0.4
0.2 VGS = 1.5 V 0 2 4 6 Drain to Source Voltage V 8 (V) DS 10
0.2 V DS = 10 V Pulse Test 0 1 2 3 Gate to Source Voltage V 4 (V) GS 5
4
2SK2980
Drain to Source Saturation Voltage vs. Gate to Source Voltage
Drain to Source Saturation Voltage V DS(on) (V)
Pulse Test
Drain to Source On State Resistance R DS(on) ( W)
0.5
Static Drain to Source on State Resistance vs. Drain Current 2 Pulse Test 1 0.5 VGS = 2.5 V 0.2 0.1
0.4
0.3
0.2
ID=1A 0.5 A 0.2 A
4V
0.1
0
6 2 4 Gate to Source Voltage
8 V GS (V)
10
0.05 0.1
0.2
0.5 1 2 Drain Current I D (A)
5
Static Drain to Source on State Resistance R DS(on) ( W)
I D = 0.1 A, 0.2 A, 0.5 A 0.4 VGS = 2.5 V 0.3
Forward Transfer Admittance |y fs | (S)
Static Drain to Source on State Resistance vs. Temperature 0.5
Forward Transfer Admittance vs. Drain Current 5 2 1 0.5 75 C 0.2 0.1 0.05 0.01 0.02 V DS = 10 V Pulse Test 0.05 0.1 0.2 0.5 Drain Current I D (A) 1
Tc = -25 C 25 C
0.2 4V 0.1 0 -40
0.1 A, 0.2 A, 0.5 A
Pulse Test 0 40 80 120 160 Case Temperature Tc (C)
5
2SK2980
Typical Capacitance vs. Drain to Source Voltage 500 VGS = 0 f = 1 MHz Coss Ciss Crss
Dynamic Input Characteristics
Capacitance C (pF)
V DS (V)
40
16
200 100 50 20 10 5 0 10 20
Drain to Source Voltage
30 V DS V GS 10
V DD = 5 V 10 V 20 V
12
20
8
V DD = 20 V 10 V 5V 2 4 6 8 Qg (nc) Gate Charge
4 0 10
30
40
50
0
Drain to Source Voltage V DS (V)
Switching Characteristics 200 100 tr 1.0
Reverse Drain Current vs. Source to Drain Voltage
Reverse Drain Current I DR (A)
Switching Time t (ns)
50 20 10 5 2 1 0.1
t d(off) tf t d(on)
0.8
0.6
5V
V GS = 0
0.4
V GS = 4 V, V DD = 10 V PW = 2 s, duty < 1 % 0.2 0.5 1 Drain Current 2 5 I D (A) 10
0.2 Pulse Test 0 0.4 0.8 1.2 1.6 2.0 Source to Drain Voltage V SD (V)
6
Gate to Source Voltage
V GS (V)
1000
50
ID=1A
20
2SK2980
Switching Time Test Circuit Vin Monitor D.U.T. RL Vin Vin 4V 50W V DD = 10 V Vout 10% 10% 90% td(on) tr 90% td(off) tf 10% Vout Monitor Waveform
90%
7
2SK2980
Package Dimensions
Unit: mm
+ 0.1 - 0.3
0.65
0.4
+ 0.10 - 0.05
0.16
+ 0.10 - 0.06
+ 0.2 - 0.6
1.5
0 ~ 0.15
0.95 1.9
0.95
+ 0.3
2.8 - 0.1
0.3
0.65 1.1 - 0.1
+ 0.2
+ 0.1 - 0.3
2.8
MPAK Hitachi Code SC-59A EIAJ TO-236Mod. JEDEC
8
Cautions
1. Hitachi neither warrants nor grants licenses of any rights of Hitachi's or any third party's patent, copyright, trademark, or other intellectual property rights for information contained in this document. Hitachi bears no responsibility for problems that may arise with third party's rights, including intellectual property rights, in connection with use of the information contained in this document. 2. Products and product specifications may be subject to change without notice. Confirm that you have received the latest product standards or specifications before final design, purchase or use. 3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However, contact Hitachi's sales office before using the product in an application that demands especially high quality and reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment or medical equipment for life support. 4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as failsafes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other consequential damage due to operation of the Hitachi product. 5. This product is not designed to be radiation resistant. 6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without written approval from Hitachi. 7. Contact Hitachi's sales office for any questions regarding this document or Hitachi semiconductor products.
Hitachi, Ltd.
Semiconductor & Integrated Circuits. Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan Tel: Tokyo (03) 3270-2111 Fax: (03) 3270-5109
URL
NorthAmerica : http:semiconductor.hitachi.com/ Europe : http://www.hitachi-eu.com/hel/ecg Asia (Singapore) : http://www.has.hitachi.com.sg/grp3/sicd/index.htm Asia (Taiwan) : http://www.hitachi.com.tw/E/Product/SICD_Frame.htm Asia (HongKong) : http://www.hitachi.com.hk/eng/bo/grp3/index.htm Japan : http://www.hitachi.co.jp/Sicd/indx.htm For further information write to:
Hitachi Semiconductor (America) Inc. 179 East Tasman Drive, San Jose,CA 95134 Tel: <1> (408) 433-1990 Fax: <1>(408) 433-0223 Hitachi Europe GmbH Electronic components Group Dornacher Strae 3 D-85622 Feldkirchen, Munich Germany Tel: <49> (89) 9 9180-0 Fax: <49> (89) 9 29 30 00 Hitachi Europe Ltd. Electronic Components Group. Whitebrook Park Lower Cookham Road Maidenhead Berkshire SL6 8YA, United Kingdom Tel: <44> (1628) 585000 Fax: <44> (1628) 778322 Hitachi Asia Pte. Ltd. 16 Collyer Quay #20-00 Hitachi Tower Singapore 049318 Tel: 535-2100 Fax: 535-1533 Hitachi Asia Ltd. Taipei Branch Office 3F, Hung Kuo Building. No.167, Tun-Hwa North Road, Taipei (105) Tel: <886> (2) 2718-3666 Fax: <886> (2) 2718-8180 Hitachi Asia (Hong Kong) Ltd. Group III (Electronic Components) 7/F., North Tower, World Finance Centre, Harbour City, Canton Road, Tsim Sha Tsui, Kowloon, Hong Kong Tel: <852> (2) 735 9218 Fax: <852> (2) 730 0281 Telex: 40815 HITEC HX
Copyright ' Hitachi, Ltd., 1999. All rights reserved. Printed in Japan.


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